The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Feb. 11, 2019
Applicant:

Commissariat À L'énergie Atomique ET Aux Énergies Alternatives, Paris, FR;

Inventor:

Sylvain Leirens, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 33/10 (2006.01); G01C 17/38 (2006.01); G01R 33/02 (2006.01); G01P 21/00 (2006.01); G01R 33/00 (2006.01); G01C 25/00 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01); G01C 17/38 (2013.01); G01C 25/00 (2013.01); G01P 21/00 (2013.01); G01R 33/0005 (2013.01); G01R 33/0206 (2013.01); G01R 33/10 (2013.01);
Abstract

A method of calibrating a triaxial sensor such as a magnetometer. The method includes steps (DIS) to calculate a spatial distribution indicator of a set of measurements output by the sensor, and to determine (AJS), using a fitting method, parameters of a parametric surface that can be used to fit said surface to the set of measurements. The fitting method is selected from among several predetermined fitting methods as a function of the spatial distribution indicator. The predetermined fitting methods may include an ellipsoid fitting method, a sphere fitting method, a sphere fitting method and a two-step fitting method consisting of a first fitting to a sphere followed by a second fitting to an ellipsoid, the centre of which is coincident with the centre of the sphere of the first fitting.


Find Patent Forward Citations

Loading…