The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10838033 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 17, 2020

Filed:

Jul. 03, 2018
Applicant:

Toshiba Memory Corporation, Minato-ku, JP;

Inventor:

Kazuhito Hayasaka, Minato, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 35/00 (2006.01); H01R 12/71 (2011.01); H01R 12/70 (2011.01); G01R 3/00 (2006.01); G01R 31/28 (2006.01); G01R 1/04 (2006.01); H01R 13/22 (2006.01); H03K 5/24 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01); G01R 1/0466 (2013.01); G01R 3/00 (2013.01); G01R 31/2886 (2013.01); H01R 12/7082 (2013.01); H01R 12/716 (2013.01); H01R 13/22 (2013.01); H03K 5/24 (2013.01);
Abstract

In one embodiment, a tester calibration device includes a first board to be installed on one of a plurality of sockets of a tester for testing a semiconductor device, when the tester is to be calibrated. The device further includes a plurality of first pins provided on a first face of the first board, and to be made contact with the one socket when the tester is to be calibrated. The device further includes a wiring configured to electrically connect some of the plurality of first pins with each other.


Find Patent Forward Citations

Hayasaka, Kazuhito. (2020). Tester calibration device and tester calibration method (U.S. Patent No. 10838033). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10838033

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