The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Jul. 10, 2018
Lockheed Martin Corporation, Bethesda, MD (US);
Arul Manickam, Bethesda, MD (US);
Peter G. Kaup, Bethesda, MD (US);
Jon C. Russo, Bethesda, MD (US);
LOCKHEED MARTIN CORPORATION, Bethesda, MD (US);
Abstract
The present disclosure relates to apparatuses and methods to utilize techniques to simultaneously measure Ramsey pulses on a plurality of axes of the magneto-optical defect center material with defect centers. When measuring simultaneously, there is potentially no relative sensitivity loss relative to scalar measurements. Therefore, Ramsey pulses on a plurality of axes of a magneto-optical defect material with defect centers are measured while bypassing the sensitivity loss incurred with sequential measurement techniques. The axes are interrogated simultaneously while allowing for isolation of the individual responses from the signal detected from the magneto-optical defect center material. In some embodiments, the system utilizes a special Ramsey pulse sequence pair or a 'shifted magnetometry adapted cancellation' (SMAC) pair to detect and measure the magnetic field acting on the system.