The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Aug. 28, 2017
Rohde & Schwarz Gmbh & Co. KG, München, DE;
Georg Schnattinger, München, DE;
Werner Perndl, Zorneding, DE;
Michael Katzer, München, DE;
Korbinian Pfaffeneder, Munich, DE;
Thomas Braunstorfinger, München, DE;
Marcel Thraenhardt, Freising, DE;
ROHDE & SCHWARZ GMBH & CO. KG, Munich, DE;
Abstract
Summarizing, the present invention relates to a test arrangement in the test method for acquiring test data in the surrounding of a device under test. At least two measurement devices are arranged in the surrounding of the device under test, wherein the two measurement devices are communicatively coupled for phase locking. At least one of the measurement devices can be moved around the device under test for acquiring measurement data, wherein the measurement devices comprise a measurement antenna and the vectorial measurement receiver. Accordingly, during the measurements, the at least one vectorial measurement receiver is moved around together with the measurement antenna, wherein the spatial relationship between the measurement antenna and the vectorial measurement receiver is remained constant during the movement.