The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Sep. 21, 2018
Applicant:

Invensense, Inc., San Jose, CA (US);

Inventors:

Omid Oliaei, Sunnyvale, CA (US);

Adolfo Giambastiani, San Marco, IT;

Assignee:

INVENSENSE, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3183 (2006.01); G01C 19/00 (2013.01); G01P 15/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2829 (2013.01); G01C 19/00 (2013.01); G01P 15/00 (2013.01); G01R 31/3183 (2013.01); G01R 31/28 (2013.01); G01R 31/282 (2013.01);
Abstract

Facilitating fault detection of a system using a test input including a linear combination of inputs of the system is presented herein. A test signal component generates, via a test procedure, a test input signal including a first linear combination of at least two input signals of the system, and applies the test input signal to the system during a phase of respective phases of the test procedure; and a fault detection component detects a fault of the system based on a test output signal corresponding to the test input signal and a second linear combination of respective output signals of the system corresponding to the at least two input signals.


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