The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Jun. 29, 2018
Applicant:

Anritsu Company, Morgan Hill, CA (US);

Inventors:

Kyle Stickle, Los Gatos, CA (US);

Karam Noujeim, Los Altos, CA (US);

Assignee:

ANRITSU COMPANY, Morgan Hill, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2822 (2013.01); G01R 31/2851 (2013.01);
Abstract

A spectrum analyzer for measuring an electrical response of a device under test (DUT) includes a test port for receiving radio frequency (RF) signals from the DUT in response to a test signal transmitted to the DUT, a local oscillator (LO) for generating a LO signal, a sampler connected with the LO to receive the LO signal and a receiver connected with the sampler. The sampler includes a non-linear transmission line that generates a sampler signal having a frequency that is a multiple of a frequency of the LO signal, and an input for receiving a RF signal from the test port. When a RF signal from an RF input source is received the sampler outputs an intermediate frequency (IF) signal. The receiver receives the IF signal output of the sampler.


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