The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
May. 16, 2016
Applicant:
The Mitre Corporation, McLean, VA (US);
Inventors:
Nicholas C. Donnangelo, Purcellville, VA (US);
Alexander V. Mamishev, Seattle, WA (US);
Walter S. Kuklinski, Princeton, MA (US);
Assignee:
The MITRE Corporation, McLean, VA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/02 (2006.01); G01N 22/00 (2006.01); G01R 33/16 (2006.01); G01R 27/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/02 (2013.01); G01N 22/00 (2013.01); G01R 27/00 (2013.01); G01R 33/16 (2013.01);
Abstract
Systems and methods are provided for remotely identifying and classifying materials based on their respective complex permittivity features. Materials of interest to be identified in later inspections are cataloged according to their respective complex permittivity features by applying electromagnetic fields to them and determining their complex permittivity features. That library of features is used to compare field measurements taken during an inspection to determine the presence of a material of interest and to identify it.