The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Sep. 04, 2018
Applicants:

Case Western Reserve University, Cleveland, OH (US);

University of Florida Research Foundation, Inc., Gainesville, FL (US);

Inventors:

Soumyajit Mandal, Shaker Heights, OH (US);

Swarup Bhunia, Gainesville, FL (US);

Naren Vikram Raj Masna, Gainesville, FL (US);

Cheng Chen, Cleveland, OH (US);

Mason Greer, Cleveland, OH (US);

Fengchao Zhang, Folsom, CA (US);

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 24/08 (2006.01); G01N 21/359 (2014.01); G01N 21/94 (2006.01); G01N 21/95 (2006.01); G01R 33/46 (2006.01); G01R 33/44 (2006.01);
U.S. Cl.
CPC ...
G01N 24/08 (2013.01); G01N 21/359 (2013.01); G01N 21/94 (2013.01); G01N 21/9508 (2013.01); G01R 33/441 (2013.01); G01R 33/448 (2013.01); G01R 33/4625 (2013.01);
Abstract

An example includes performing near infra-red (NIR) spectrometry to provide NIR measurement data for a sample compound. The method also includes performing magnetic resonance (MR) spectrometry to provide MR measurement data for the sample compound. The method also includes analyzing, by a computing device, the MR measurement data in view of the NIR measurement data to characterize the sample compound.


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