The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Apr. 24, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Toshiyuki Ishii, Tokyo, JP;

Takahiro Suzuki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/57 (2006.01); G01N 21/47 (2006.01); G01N 21/55 (2014.01);
U.S. Cl.
CPC ...
G01N 21/57 (2013.01); G01N 21/4738 (2013.01); G01N 21/55 (2013.01); G01N 2021/4704 (2013.01); G01N 2021/4735 (2013.01); G01N 2021/555 (2013.01);
Abstract

To provide a technique of obtaining the reflection characteristics of an object, which can reproduce the appearance of the object more correctly, an information processing apparatus obtains a plurality of measurement values by receiving, from each of a plurality of directions, reflected light from an object illuminated by light from a given direction, and derives, based on the plurality of measurement values, a characteristic of specular reflection light as a reflected light component in a specular reflection direction corresponding to the given direction with respect to a surface of the object, a characteristic of internal diffuse reflection light as a reflected light component after scattering and absorption in the object, and a characteristic of surface diffuse reflection light as a reflected light component which has been diffused on the surface of the object.


Find Patent Forward Citations

Ishii, Toshiyuki. (2020). Information processing apparatus, method of deriving reflection characteristics, program, and reflection characteristic profile (U.S. Patent No. 10837903). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10837903

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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