The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Jan. 09, 2019
Applicants:

Shahid Abbas Haider, Waterloo, CA;

Alexander Sheung Lai Wong, Waterloo, CA;

Farnoud Kazemzadeh, Waterloo, CA;

Inventors:

Shahid Abbas Haider, Waterloo, CA;

Alexander Sheung Lai Wong, Waterloo, CA;

Farnoud Kazemzadeh, Waterloo, CA;

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01N 21/21 (2006.01);
U.S. Cl.
CPC ...
G01N 21/21 (2013.01); G01N 2201/0683 (2013.01);
Abstract

There is disclosed a system and method for measuring the polarization of light which utilizes a spatially-varying polarization beam. This measurement is analyzed and improved using novel imaging methods and image processing methods on a digital signal processing (DSP) system to determine the polarization of light. Various embodiments are described which can measure light polarization, determine polarizing material distributions, determine the optical rotary dispersion of samples, and determine the circular dichroism of samples. In certain embodiments, the binding constants and binding activity of molecular samples can be achieved. Given its reduced complexity and size, the system may be configured to be portable such that the system may be used in various applications outside of a lab setting.


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