The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Sep. 11, 2012
David Michael Spriggs, Malvern, GB;
David Michael Spriggs, Malvern, GB;
Malvern Panalytical Limited, Malvern, GB;
Abstract
Apparatus () for measuring the particle-size distribution of a sample by light-scattering comprises a focusing optic () for producing a converging beam () generally along a propagation axis z. The apparatus comprises a mounting system which allows a dry sample cell (A) and a wet sample cell (B) to be mounted in the converging beam at different times and in respective planes which are mutually inclined so that in use of the apparatus respective positions () at which transmitted light is focused for the two cells have a difference in displacement from the z axis that is less than for the case where the respective planes are substantially parallel. This allows use of a cheaper and less complex translation stage within the apparatus for mounting an optical detector for locating the two focus positions.