The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Jul. 26, 2019
Applicant:

The Aerospace Corporation, El Segundo, CA (US);

Inventors:

Uttam Paudel, El Segundo, CA (US);

Todd S. Rose, El Segundo, CA (US);

Assignee:

The Aerospace Corporation, El Segundo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/45 (2006.01);
U.S. Cl.
CPC ...
G01J 3/45 (2013.01); G01J 2003/451 (2013.01);
Abstract

A speckle-enhanced discrete Fourier transform spectrometer can include waveguides configured to combine speckle spectroscopy techniques with discrete Fourier transform spectroscopy techniques. A discrete Fourier transform spectrometer section can be a compact, passive, chip-scale optical spectrometer. A speckle spectrometer section can include a multi-mode wave guide. An interference region can be in optical communication with both the discrete Fourier transform spectrometer section and the speckle spectrometer section such that light from both sections interfere in the interference region. A detector can be used to detect light from the interference region for detecting spectral content of light over a large bandwidth at a high resolution.


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