The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Mar. 01, 2019
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Assignee:
Seiko Epson Corporation, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01J 3/28 (2006.01); G01J 3/02 (2006.01); G01J 3/26 (2006.01); G01J 3/51 (2006.01); G01N 21/25 (2006.01); G01N 21/88 (2006.01); G01N 21/95 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/0205 (2013.01); G01J 3/0264 (2013.01); G01J 3/26 (2013.01); G01J 3/51 (2013.01); G01N 21/251 (2013.01); G01N 21/8806 (2013.01); G01J 2003/2826 (2013.01); G01N 2021/845 (2013.01); G01N 2021/8845 (2013.01); G01N 2021/9513 (2013.01);
Abstract
An inspection apparatus includes a spectroscopic imager that spectroscopically separates light from a predetermined imaging range of an inspection object into light of a plurality of wavelengths and images spectroscopic images of each of the wavelengths, a shape inspection unit that inspects a shape of the inspection object using a spectroscopic image of a predetermined wavelength among the spectroscopic images of each of the wavelengths, and a color inspection unit that inspects a color of the inspection object using the spectroscopic images of each of the wavelengths.