The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Feb. 28, 2018
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Takuro Moriyama, Kanagawa, JP;

Hideyuki Aisu, Kanagawa, JP;

Hisaaki Hatano, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G01D 3/08 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G01D 18/00 (2013.01); G01D 3/08 (2013.01); G05B 23/0232 (2013.01);
Abstract

According to one embodiment, a sensor failure diagnosis device includes a drift estimator and a global rank determiner. The drift estimator estimates, based on data on measured values from sensors contained in a plurality of sensor groups including a sensor under inspection, whether or not drift failure that is steady deviation of a measured value from a true value has occurred in the sensor under inspection or a degree of the drift failure. The global rank determiner determines global ranks that are priorities of the plurality of sensor groups in the inspection based on a plurality of estimated results by the drift estimator.


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