The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Sep. 17, 2019
Topcon Corporation, Tokyo, JP;
Satoshi Yasutomi, Tokyo, JP;
Yuji Takano, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
Provided is an angle detection system including: a target unit including a reflection target and an encoder pattern showing an angle of the target unit; and a surveying instrument including a survey unit configured to measure a distance and angle to the reflection target, an encoder pattern reading unit configured to read a bit pattern of the encoder pattern from an image of the encoder pattern, a display unit, and an arithmetic control unit. The surveying instrument includes at least one imaging unit changeable in focal length, and is configured to calculate a distance and angle to the reflection target, to set an imaging magnification of the imaging unit, to set a cutout region of the encoder pattern by using the image displayed on the display unit, to determine success of identification of the encoder pattern and, in the case of success, to calculate an encoder pattern read angle.