The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Aug. 29, 2016
Applicant:

Kyocera Corporation, Kyoto, JP;

Inventor:

Hayato Kubo, Satsumasendai, JP;

Assignee:

KYOCERA Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 27/14 (2006.01); C23C 16/36 (2006.01); C23C 16/02 (2006.01); C23C 16/34 (2006.01); C23C 28/04 (2006.01); B23B 27/14 (2006.01); C23C 16/40 (2006.01);
U.S. Cl.
CPC ...
C23C 16/36 (2013.01); B23B 27/148 (2013.01); C23C 16/0272 (2013.01); C23C 16/34 (2013.01); C23C 16/403 (2013.01); C23C 28/042 (2013.01); C23C 28/044 (2013.01); B23B 2224/04 (2013.01); B23B 2224/32 (2013.01);
Abstract

A cutting tool in an embodiment includes a base member composed of cemented carbide and a coating layer located on a surface of the base member. The coating layer includes a first layer which is in contact with the base member and contains Ti(CN) (0≤x≤1). A KAM average value of WC particles in a region extending to a depth of 5 μm from the surface of the base member is 1° or less, which is measured by electron backscatter diffraction (EBSD) method using a scanning electron microscope with an electron backscatter diffraction imaging system.


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Kubo, Hayato. (2020). Coated tool (U.S. Patent No. 10837104). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10837104

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