The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Feb. 01, 2017
The University of North Carolina AT Chapel Hill, Chapel Hill, NC (US);
Pavel Chtcheprov, Chapel Hill, NC (US);
Otto Z. Zhou, Chapel Hill, NC (US);
Jianping Lu, Chapel Hill, NC (US);
The University of North Carolina at Chapel Hill, Chapel Hill, NC (US);
Abstract
Optical geometry calibration devices, systems, and related methods for x-ray imaging are disclosed. An optical-based geometry calibration device is configured to interface with a two-dimensional (2D) imaging device to perform three-dimensional (3D) imaging. The optical-based geometry calibration device includes one or more optical cameras fixed to either an x-ray source or an x-ray detector, one or more markers fixed to the x-ray detector or the x-ray source, with each of the one or more optical cameras being configured to capture at least one photographic image of one or more corresponding optical markers when each x-ray image of the object is captured, and an image processing system configured to compute positions of the x-ray source relative to the x-ray detector for each 2D projection image based on the at least one photographic image of the one or more markers.