The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Jan. 24, 2019
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Dejun Wang, Beijing, CN;

Srikrishnan V, Bangalore, IN;

Gireesha Rao, Pewaukee, WI (US);

Katelyn Rose Nye, Milwaukee, WI (US);

Nasir Ahmed Desai, Bangalore, IN;

Arun Kumar Chandrashekarappa, Bangalore, IN;

Huanzhong Li, Beijing, CN;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 7/00 (2017.01); H04N 5/32 (2006.01); G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5241 (2013.01); A61B 6/542 (2013.01); G06T 7/0012 (2013.01); H04N 5/32 (2013.01); G01T 1/20 (2013.01); G06T 2207/10116 (2013.01);
Abstract

Various methods and systems are provided for x-ray imaging. In one embodiment, a method for an image pasting examination comprises acquiring, via an optical camera and/or depth camera, image data of a subject, controlling an x-ray source and an x-ray detector according to the image data to acquire a plurality of x-ray images of the subject, and stitching the plurality of x-ray images into a single x-ray image. In this way, optimal exposure techniques may be used for individual acquisitions in an image pasting examination such that the optimal dose is utilized, stitching quality is improved, and registration failures are avoided.


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