The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2020
Filed:
Jun. 26, 2019
Fujifilm Corporation, Tokyo, JP;
Groove X, Inc., Tokyo, JP;
Yoshihisa Usami, Tokyo, JP;
Nobuya Tanaka, Tokyo, JP;
Hajime Terayoko, Tokyo, JP;
Kaname Hayashi, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
GROOVE X, INC., Tokyo, JP;
Abstract
Provided is a three-dimensional information detection device having a configuration in which detection accuracy of three-dimensional information of a measurement target object is not lowered even in a case where an optical system that includes a projection unit, a first imaging unit and a second imaging unit is covered with a light transmissive cover so that the optical system is not exposed to the outside. The three-dimensional information detection device includes the projection unit that projects an image pattern onto a measurement target object, the first imaging unit and the second imaging unit that respectively image the image pattern, a transmissive cover that covers the optical system that includes the projection unit, the first imaging unit, and the second imaging unit, and a calculation unit that calculates three-dimensional information of the measurement target object on the basis of the image pattern that is imaged using the first imaging unit and the second imaging unit. At least a part of a mounting surface of the optical system is formed by a light absorbing member, and the first imaging unit and the second imaging unit are disposed out of a region to which reflected light that is regularly reflected from the cover in projection light of the image pattern is directly incident.