The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2020

Filed:

Mar. 27, 2017
Applicant:

Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);

Inventors:

Chen Feng, Cambridge, MA (US);

Yuichi Taguchi, Arlington, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/20 (2006.01); G06T 17/30 (2006.01);
U.S. Cl.
CPC ...
G06T 17/20 (2013.01); G06T 17/30 (2013.01); G06T 2210/56 (2013.01);
Abstract

A first T-spline fitting system includes a three-dimensional (3D) sensor, a processor and a memory storing a program for representing a point cloud of the scene using T-spline representation. The system executes acquiring an image of the scene using the 3D sensor, generating the point cloud from the image, determining a parameterized domain of the point cloud by mapping data points of the point cloud to values of parameters of the parameterized domain, partitioning recursively the parameterized domain into a set of patches, connecting the patches to form a T-mesh defining topology of control points in the parameterized domain, and fitting a T-spline surface into the point cloud according to the T-mesh to determine positions of the control points.


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