The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2020
Filed:
Dec. 20, 2016
Photonic Sensors & Algorithms, S.l., Valencia, ES;
Jorge Vicente Blasco Claret, Valencia, ES;
Carles Montoliu Alvaro, Valencia, ES;
Arnau Calatayud Calatayud, Valencia, ES;
Leticia Carrion, Valencia, ES;
Adolfo Martinez Uso, Valencia, ES;
PHOTONIC SENSORS & ALGORITHMS, S.L., Valencia, ES;
Abstract
A device and method for obtaining depth information from a light field is provided. The method generating a plurality of epipolar images from a light field captured by a light field acquisition device; an edge detection step for detecting, in the epipolar images, edges of objects in the scene captured by the light field acquisition device; for each epipolar image, detecting valid epipolar lines formed by a set of edges; and determining the slopes of the valid epipolar lines. In a preferred embodiment, the method extend the epipolar images with additional information of images captured by additional image acquisition devices and obtain extended epipolar lines. The edge detection step calculates a second spatial derivative for each pixel of the epipolar images and detects the zero-crossings of the second spatial derivatives.