The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2020
Filed:
May. 14, 2018
Koninklijke Philips N.v., Eindhoven, NL;
Yale University, New Haven, CT (US);
Johanna Van Breugel, Cambridge, MA (US);
Aaron Abajian, Cambridge, MA (US);
John Treilhard, Cambridge, MA (US);
Susanne Smolka, Cambridge, MA (US);
Julius Chapiro, Berlin, DE;
James Duncan, Cambridbe, MA (US);
MingDe Lin, New Haven, CT (US);
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
YALE UNIVERSITY, New Haven, CT (US);
Abstract
The described implementations relate to systems, methods, and apparatuses for generating regions of interest () from imaging data (). Specifically, the regions of interest are generated for tracking treatment efficacy in a more consistent and repeatable manner. The regions of interest can be generated from contrast medium and non-contrast medium enhanced scans () of a patient. Voxel data derived from the scans can be collected and distributed according to respective intensity values in order to identify mode voxels () for particular ranges () of intensities. Regions of interest () can then be generated for each identified mode voxel, and standard deviations for the regions of interest can be determined. One or more thresholds can be derived from the determined standard deviations in order to further filter the intensity values and identify filtered groups of voxels to be the resulting regions of interest.