The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2020

Filed:

Sep. 25, 2018
Applicant:

Adobe Inc., San Jose, CA (US);

Inventor:

John Peterson, Menlo Park, CA (US);

Assignee:

ADOBE INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); G06T 3/00 (2006.01); G06T 7/13 (2017.01); G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4038 (2013.01); G06T 3/0093 (2013.01); G06T 7/13 (2017.01); G06T 11/203 (2013.01); G06T 2207/20021 (2013.01);
Abstract

Methods, systems, and non-transitory computer readable storage media are disclosed for applying piecewise deformations to digital content using a plurality of parametric patches. For example, the disclosed system generates a plurality of parametric patches (e.g., Bezier patches) within a parametric quilt for digital content (e.g., a digital image or digital text). The disclosed system also provides interface controls for user-defined split/patch locations for the parametric quilt. In one or more embodiments, the disclosed system divides digital content into a plurality of portions. The disclosed system modifies one or more parametric patches and deforms a corresponding portion(s) of the digital content based on the modified parametric patch(es). The disclosed system then recombines the portions of the digital content to generate modified digital content that includes any deformations based on the modified parametric patch(es).


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