The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2020
Filed:
Nov. 01, 2016
Deere & Company, Moline, IL (US);
Sebastian Blank, Moline, IL (US);
Robert A. Stevens, Moline, IL (US);
Dohn W. Pfeiffer, Bettendorf, IA (US);
Noel W. Anderson, Fargo, ND (US);
James J. Phelan, Bettendorf, IA (US);
Deere & Company, Moline, IL (US);
Abstract
A sensing system bias is reduced across a first agricultural machine and a second agricultural machine. A collection of agronomic data is accessed, that is indicative of an estimated crop yield. The collection that is accessed, for example, includes at least a first set of data sensed by the first agricultural machine and a second set of data sensed by the second agricultural machine. In addition, the first and second sets of data can be scaled based on a yield correction factor. A bias between the scaled first set of data and the scaled second set of data is determined, and a smoothing operation is performed on the scaled first and second sets of data. For example, performing the smoothing operation can include generating a calibration correction factor based on the determined bias, removing the bias between the scaled first set of data and the scaled second set of data to obtain a corrected set of crop yield data, and using the calibration correction factor in sensing the first set of data on the first agricultural machine and the second set of data on the second agricultural machine.