The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2020

Filed:

Jul. 06, 2020
Applicant:

Sas Institute Inc., Cary, NC (US);

Inventors:

Yingjian Wang, Apex, NC (US);

Xinmin Wu, Cary, NC (US);

Assignee:

SAS INSTITUTE INC., Cary, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06N 20/00 (2019.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6223 (2013.01); G06K 9/6228 (2013.01); G06K 9/6261 (2013.01); G06N 7/005 (2013.01); G06N 20/00 (2019.01);
Abstract

Machine-learning models (MLM) can be configured more rapidly and accurately according to some examples. For example, a system can receive a first training dataset that includes (i) independent-variable values corresponding to independent variables and (ii) dependent-variable values corresponding to a dependent variable that is influenced by the independent variables. The independent-variable values can include nonlinear-variable values corresponding to at least one nonlinear independent variable. The system can then determine cluster assignments for the nonlinear-variable values, generate a second training dataset based on the cluster assignments, and train a model based on the second training dataset. The trained machine-learning model may then be used in various applications, such as control-system applications.


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