The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2020

Filed:

Jul. 30, 2019
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Quoc-Huy Tran, Santa Clara, CA (US);

Mohammed E. Fathy Salem, Hyattsville, MD (US);

Muhammad Zeeshan Zia, San Jose, CA (US);

Paul Vernaza, Sunnyvale, CA (US);

Manmohan Chandraker, Santa Clara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06T 17/00 (2006.01); G06T 19/00 (2011.01);
U.S. Cl.
CPC ...
G06K 9/6211 (2013.01); G06K 9/6232 (2013.01); G06T 17/00 (2013.01); G06T 19/006 (2013.01);
Abstract

A method for estimating dense 3D geometric correspondences between two input point clouds by employing a 3D convolutional neural network (CNN) architecture is presented. The method includes, during a training phase, transforming the two input point clouds into truncated distance function voxel grid representations, feeding the truncated distance function voxel grid representations into individual feature extraction layers with tied weights, extracting low-level features from a first feature extraction layer, extracting high-level features from a second feature extraction layer, normalizing the extracted low-level features and high-level features, and applying deep supervision of multiple contrastive losses and multiple hard negative mining modules at the first and second feature extraction layers. The method further includes, during a testing phase, employing the high-level features capturing high-level semantic information to obtain coarse matching locations, and refining the coarse matching locations with the low-level features to capture low-level geometric information for estimating precise matching locations.


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