The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2020

Filed:

Jul. 30, 2018
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Cory Lappi, Rochester, MN (US);

William Jared Walker, Rochester, MN (US);

Xin Chen, Rochester, MN (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 12/0804 (2016.01);
U.S. Cl.
CPC ...
G06F 12/0804 (2013.01); G06F 11/0727 (2013.01); G06F 11/0751 (2013.01); G06F 11/0766 (2013.01); G06F 11/0778 (2013.01); G06F 2212/1032 (2013.01);
Abstract

The present disclosure generally relates to a storage device sensing critical failure or PLI events and writing the debug data to a memory device so that when boot-up occurs, at least some debug data is available. A dedicated hardware unit detects when one or more critical failure conditions occur by monitoring the one or more critical failure conditions. The critical failure conditions being detected or sensed triggers the dedicated hardware unit to automatically write debug data stored in a volatile memory device to a non-volatile memory device. The debug data stored in the non-volatile memory device provides a critical failure or PLI trace to determine what occurred leading up to and during a critical failure event. By writing the debug data to the non-volatile memory device, the critical failure trace may be accessed and analyzed after the device powers down or fails.


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