The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2020

Filed:

Jul. 18, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kristin E. McNeil, Charlotte, NC (US);

Itai Gordon, Modiin, IL;

Radha Radha Mohan De, Howrah, IN;

Miriam Nizri, Jerusalem, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 9/44 (2018.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3688 (2013.01); G06N 7/005 (2013.01); G06F 11/3608 (2013.01); G06F 11/3668 (2013.01); G06F 11/3692 (2013.01);
Abstract

A developer is monitored by at least one sensor, and developer data is gathered from the at least one sensor. Code change data is gathered for changes made by the monitored developer to at least one area of code, and the code change data is mapped to the developer data. Test cases are run to test the at least one area of code, and to identify failed test cases. Code change data corresponding to the failed test cases is also identified, as well as developer data mapped to the corresponding code change data. Further, a prediction model that correlates test case failure with the developer data is generated. The prediction model is used to generate probabilities of failure for test cases based on a new developer data mapped to new code test data.


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