The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2020
Filed:
Oct. 19, 2017
International Business Machines Corporation, Armonk, NY (US);
James N. Klazynski, Austin, TX (US);
Douglas L. Lehr, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for testing a multi-core integrated circuit device including a plurality of processing cores includes testing a first processing core on the integrated circuit device utilizing one or more tests. If a first feature on the first processing core fails a first test, the method includes performing a second test on the first processing core that tests the first processing core without the first feature. The method includes determining, based on the second test, if the first processing core is operable without the first feature. If the first processing core is operable without the first feature, the method includes storing information about the first processing core's capabilities in vital product data.