The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2020
Filed:
May. 18, 2018
Applicant:
Omron Corporation, Kyoto, JP;
Inventor:
Shinsuke Kawanoue, Kyoto, JP;
Assignee:
OMRON Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/05 (2006.01); G06F 16/2458 (2019.01); G05B 19/042 (2006.01); G06F 16/248 (2019.01);
U.S. Cl.
CPC ...
G05B 19/054 (2013.01); G05B 19/0428 (2013.01); G06F 16/248 (2019.01); G06F 16/2465 (2019.01); G06F 16/2471 (2019.01); G06F 16/2474 (2019.01); G06F 16/2477 (2019.01); G05B 2219/1101 (2013.01); G05B 2219/13144 (2013.01);
Abstract
An item for designating a time stamp accuracy is added to an inquiry syntax of a query. At the time of table coupling, a query designating the desired accuracy in the item is transmitted. This query is analyzed by a query parser, and individual queries are created for each database targeted for inquiry and transmitted. At the time of coupling acquired tables, the number of digits of the time stamps is adjusted to be the same in accordance with the designated accuracy, and the tables are coupled in chronological order of the time stamps.