The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2020
Filed:
Aug. 26, 2014
S.d. Sight Diagnostics Ltd., Jerusalem, IL;
Noam Yorav Raphael, Jerusalem, IL;
Yuval Greenfield, Tel Aviv, IL;
Joseph Joel Pollak, Neve Daniel, IL;
Yonatan Bilu, Jerusalem, IL;
S.D. Sight Diagnostics Ltd., Jerusalem, IL;
Abstract
Methods, systems and computer program products relating to digital microscopy are disclosed. A digital microscopy method may comprise capturing a plurality of overlapping images of a sample, wherein the capturing of at least one of the plurality of images is performed while the sample and a focal plane are in relative motion along an optical axis at a speed greater than zero; and processing the plurality of images using a reference criterion to determine a reference relative arrangement of the focal plane and the sample along the optical axis.