The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2020
Filed:
Jun. 15, 2017
Applicant:
Q-linea Ab, Uppsala, SE;
Inventors:
Jonas Jarvius, Uppsala, SE;
Jan Grawe, Uppsala, SE;
Assignee:
Q-Linea AB, Uppsala, SE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/24 (2006.01); G02B 21/34 (2006.01); G02B 27/40 (2006.01); G01N 21/64 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/34 (2013.01); B01L 3/502715 (2013.01); G01N 21/6452 (2013.01); G02B 21/241 (2013.01); G02B 27/40 (2013.01); G01N 2021/6482 (2013.01);
Abstract
A sample holderfor use in a device for image-based analysis of multiple samples, the sample holder comprising: an optically flat surface; multiple locations of interestdispersed across the optically flat surfacethat each, in use, correspond to locations of a sample of the multiple samples; and multiple focal structuresassociated with the multiple locations of interest; wherein the focal structureseach comprise at least one pyramid shaped indentationin the optically flat surface