The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2020
Filed:
Jun. 07, 2018
Applicant:
Mitaka Kohki Co., Ltd., Tokyo, JP;
Inventor:
Minoru Ishima, Kanagawa, JP;
Assignee:
MITAKA KOHKI CO., LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 7/00 (2006.01); A61B 50/26 (2016.01); A61B 90/25 (2016.01); F16M 11/06 (2006.01); F16M 11/18 (2006.01); A61B 90/50 (2016.01);
U.S. Cl.
CPC ...
G02B 7/001 (2013.01); A61B 50/26 (2016.02); A61B 90/25 (2016.02); A61B 90/50 (2016.02); F16M 11/06 (2013.01); F16M 11/18 (2013.01);
Abstract
A weight balance method of a surgical microscope is able to automatically align, in response to a switching operation, a center of gravity G of the surgical microscopewith a rotary shaft S. A weight balance of the surgical microscope is easily attained only by slanting the surgical microscope, and therefore, no part of the surgical microscope protrudes upward to interfere with a supporting structure of the surgical microscope.