The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2020

Filed:

Dec. 13, 2018
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Corbett Rowell, Munich, DE;

Guido Apenburg, Munich, DE;

Stefan Ullrich, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H04B 17/00 (2015.01); H04B 17/29 (2015.01); G01K 17/08 (2006.01); G01R 29/10 (2006.01); H04B 17/15 (2015.01);
U.S. Cl.
CPC ...
G01R 31/2874 (2013.01); G01K 17/08 (2013.01); G01R 29/105 (2013.01); G01R 31/2879 (2013.01); H04B 17/0085 (2013.01); H04B 17/29 (2015.01); G01K 2217/00 (2013.01); H04B 17/15 (2015.01);
Abstract

An over-the-air test system for measuring the radiation performance as a function of temperature of a device under test is described, wherein the device under test has at least one antenna unit and at least one radio frequency circuit. The over-the-air test system comprises a measurement antenna unit, a measurement unit for at least one of signal generation and signal analysis, an enclosure that provides an internal space for accommodating the device under test for testing purposes in a sealed manner, and an atmosphere conditioning system that is configured to adapt the atmosphere within the internal space. The enclosure comprises at least one sealable opening via which the internal space is connectable with the atmosphere conditioning system to adapt the atmosphere within the internal space for the testing. Further, a method for measuring the over-the-air performance of a device under test is described.


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