The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2020
Filed:
Apr. 06, 2016
National University Corporation Nagoya University, Aichi, JP;
Yoshinobu Baba, Aichi, JP;
Noritada Kaji, Aichi, JP;
Takao Yasui, Aichi, JP;
Tomoji Kawai, Osaka, JP;
Takeshi Yanagida, Osaka, JP;
NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY, Nagoya, JP;
Abstract
Provided is a device for electrical measurement designed to be able to perform high sensitivity detection by reading not only changes in steady-state current, but also the occurrence of transient current, and an electrical measurement apparatus including the device for electrical measurement. The device for electrical measurement includes a substrate on which are formed at least a sample separation channel and a sample migration channel, as well as a sample measuring unit, with one end of the sample separation channel formed to connect to one end of the sample migration channel, and the sample measuring unit including a first measuring unit connected to the sample migration channel, and a second measuring unit connected to the sample migration channel from the reverse side to the first measuring unit.