The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2020
Filed:
May. 16, 2019
Applicant:
Magic Leap, Inc., Plantation, FL (US);
Inventors:
Timothy Mark Dalrymple, Gainesville, FL (US);
Andrew C. Duenner, Houston, TX (US);
Mark Schmitt, Plantation, FL (US);
Assignee:
Magic Leap, Inc., Plantation, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01M 11/00 (2006.01); B29D 11/00 (2006.01); C03B 37/025 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G01M 11/30 (2013.01); B29D 11/00721 (2013.01); C03B 37/0253 (2013.01); G02B 21/365 (2013.01);
Abstract
Described are systems and techniques for characterizing optical fibers. Disclosed systems and techniques employ optical metrology, functional metrology, or both to characterize microstructured optical fibers and determine fiber characteristics, errors, and quality control metrics. The characteristics, errors, and quality control metrics are useful for improving the manufacturing of optical fibers.