The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2020
Filed:
Jun. 05, 2019
Ckd Corporation, Aichi, JP;
Yukihiro Taguchi, Aichi, JP;
Tadashi Inoguchi, Aichi, JP;
CKD CORPORATION, Aichi, JP;
Abstract
An inspection device for inspecting an inspection object of a PTP sheet including a pocket portion formed in a container film, and a cover film mounted to the container film to close the pocket portion, or a portion of a PTP film forming the PTP sheet, includes: an irradiator that irradiates the inspection object with a predetermined light; an imaging device that takes an inspection image of the irradiated inspection object and a peripheral portion of the inspection object; and a processor that: determines whether the inspection object is defective or non-defective based on inspection image data of the inspection object taken from the inspection image. The inspection image data includes data of respective pixels corresponding to an inspection target area subjected to the defective/non-defective determination, and data of respective pixels corresponding to a non-inspection target area that excludes the inspection target area.