The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2020

Filed:

Jan. 04, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Koichiro Wanda, Yokohama, JP;

Takaaki Endo, Urayasu, JP;

Kiyohide Satoh, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 5/055 (2006.01); A61B 8/08 (2006.01);
U.S. Cl.
CPC ...
A61B 8/4245 (2013.01); A61B 5/055 (2013.01); A61B 8/00 (2013.01); A61B 8/42 (2013.01); A61B 8/5238 (2013.01); A61B 8/54 (2013.01);
Abstract

This invention provides a technique to dynamically set an imaging parameter appropriate for observing a region of interest on an object to generate a high-quality echogram while maintaining the operability to change the position and orientation of a probe. A region-of-interest acquisition unit acquires region information that defines the region of interest. A position and orientation acquisition unit acquires position and orientation information representing the position and orientation of a probe. A parameter deciding unit obtains an imaging parameter based on the positional relationship between an imaging range decided based on the position and orientation information and the region of interest defined by the region information, and outputs the obtained imaging parameter to an imaging unit.


Find Patent Forward Citations

Loading…