logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10827667 B1

PDFFull Text
Date of Patent:
Nov. 10, 2020

Filed:

Dec. 13, 2018

Yield monitor for windrow-collected material

Applicant:

Clemson University Research Foundation, Clemson, SC (US);

Inventors:

Kendall R. Kirk, Aiken, SC (US);

H. Guy Ramsey, IV, Sharon, SC (US);

Assignee:

Clemson University Research Foundation, Clemson, SC (US);

Attorneys:

Kim and Lahey Law Firm, LLC

Douglas W. Kim

Seann P. Lahey

Primary Examiner:

Manuel A Rivera Vargas

Int. Cl.
CPC ...
A01B 79/00 (2006.01); A01D 89/00 (2006.01); A01F 15/08 (2006.01); G01G 17/00 (2006.01); A01F 15/07 (2006.01); G01G 17/02 (2006.01); G01B 17/00 (2006.01); G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
A01B 79/005 (2013.01); A01D 89/006 (2013.01); A01F 15/071 (2013.01); A01F 15/0825 (2013.01); A01F 15/0883 (2013.01); G01G 17/00 (2013.01); G01G 17/02 (2013.01); A01F 2015/077 (2013.01); A01F 2015/0891 (2013.01); G01B 11/00 (2013.01); G01B 17/00 (2013.01);
Abstract

Disclosed are methods and systems for determining the amount of material contained in a windrow. In particular embodiments, the methods and systems are applicable to agricultural applications, and in particular to hay yield monitoring. Systems include a remote sensing technology to determine windrow height. Remote sensing methods can include ultrasonic sensors, optical sensors, and the like. Systems can provide real time yield data.

Find Patent Forward Citations

Quick Actions:

Kirk, Kendall. (2020). Yield monitor for windrow-collected material (U.S. Patent No. 10827667). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10827667

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…