The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Jan. 16, 2018
Tutela Technologies Ltd., Victoria, CA;
Brennen Stephen Chow, Port Coquitlam, CA;
Hunter Banford Bulmer MacDonald, Keswick Ridge, CA;
David Daniel Yarish, Victoria, CA;
Anthony Sean Kroeker, Victoria, CA;
Stephen William Neville, Victoria, CA;
Thomas E. Darcie, Victoria, CA;
Tutela Technologies Ltd., Victoria, CA;
Abstract
There is provided a method of evaluating wireless device performance, and/or wireless network performance, and/or wireless network usage trends, on a wireless electronic device, the method comprising: providing wireless device software on the wireless electronic device, the wireless device software being embedded in an application or memory of the wireless electronic device, and being operable to perform at least one test associated with characteristics and/or location of the device, and/or performance of the device and/or the network, and/or usage of the device by a user; communicating with at least one of: i) an operating system of the wireless electronic device and ii) an external testing server to perform the at least one test, wherein the at least one test is performed according to at least one testing parameter provided in a configuration and/or the wireless device software, the at least one testing parameter comprising at least one behavioural criterion that controls the impact of the testing on the operation of the wireless electronic device; collecting test data resulting from the performance of the at least one test; and providing the test data to a collection server.