The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

May. 20, 2016
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Martin Kollar, Kosice, SK;

Yizhi Yao, Beijing, CN;

Malgorzata Tomala, Wroclaw, PL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04L 12/26 (2006.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04L 43/0888 (2013.01); H04W 24/10 (2013.01);
Abstract

Methods, apparatuses, and computer program products for measuring throughput as a measure of performance and/or quality of service are provided. One method comprises, over an observation period for at least one of an uplink direction and a downlink direction, measuring an amount of padding bits in each protocol data unit (PDU) that is successfully transmitted in the said direction and that carries data relevant to a given throughput measure. The method may also comprise transforming the measured amounts of padding bits to the time domain and summing the transformed amounts of padding in the time domain. The method may also comprise utilizing the summed amount of padding in the time domain to account for small data transmissions in a calculation for the given throughput measure.


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