The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Jul. 17, 2018
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Eugen Pritzkau, Wiesloch, DE;

Wei-Guo Peng, Elztal, DE;

Omar-Alexander Al-Hujaj, Bad Schönborn, DE;

Lin Luo, Rauenberg, DE;

Volker Guzman, Heidelberg, DE;

Kevin Schwab, Sandhausen, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); H04L 63/1416 (2013.01); H04L 63/20 (2013.01);
Abstract

A first Event is identified from a normalized log persistency layer, where the first Event is associated with an attack on a computing system. A plurality of Events are fetched from the normalized log persistency layer, where each fetched Event correlates with its neighboring fetched Event by at least one correlation attribute, and each of the fetched Event and the first Event are presented on a graphical user interface as a chain of events. A workspace is generated, where the workspace comprises a series of attack paths, where each attack path corresponds to one Event in the chain of events. An ETD pattern is created based on the attack paths in the workspace.


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