The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Jan. 16, 2019
Applicant:

Hycon Technology Corp., Taipei, TW;

Inventors:

Po-Yin Chao, Taipei, TW;

Hung-Wei Chen, Taipei, TW;

Shui-Chu Lee, Taipei, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03F 3/45 (2006.01); G01R 19/00 (2006.01); H03F 1/30 (2006.01); H03F 3/393 (2006.01);
U.S. Cl.
CPC ...
H03F 3/45753 (2013.01); G01R 19/0053 (2013.01); H03F 1/301 (2013.01); H03F 3/393 (2013.01); H03F 3/45179 (2013.01);
Abstract

Disclosed is a high accurate measurement circuit, and the feature is using bias switching circuit for compensating front end offset, and the back end offset of amplifier is also cancelled. In the real measurement environment, offset exists in the amplifier of the measurement circuit has, and non-ideal effects also exist in the interface between measurement terminal and the measurement circuit, such as leakage current of chip package pins or mismatch of the circuit. The above non-ideal effects belong to front end offset and cannot be compensated by the prior arts. The disclosed structure uses the bias switch circuit and uses different switching method in the two measurement timings. By subtracting the measurement results for the two measurement timings, the front end offset is compensated, and the back end offset of the amplifier is also cancelled.


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