The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Jun. 27, 2013
Applicant:

Jx Nippon Mining & Metals Corporation, Tokyo, JP;

Inventors:

Yoshitaka Shibuya, Hitachi, JP;

Kazuhiko Fukamachi, Hitachi, JP;

Atsushi Kodama, Hitachi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 15/01 (2006.01); H01R 13/03 (2006.01); H05K 1/18 (2006.01); C23C 22/07 (2006.01); C25D 5/10 (2006.01); H01R 4/58 (2006.01); C25D 7/00 (2006.01); C22C 5/06 (2006.01); C25D 5/12 (2006.01); C25D 5/50 (2006.01); H01B 1/02 (2006.01); C25D 5/48 (2006.01); C25D 11/36 (2006.01); C23C 28/02 (2006.01); C25D 9/02 (2006.01); H01R 43/00 (2006.01); C25D 3/56 (2006.01); C25D 3/12 (2006.01); C25D 3/38 (2006.01); C25D 3/46 (2006.01); C25D 3/30 (2006.01);
U.S. Cl.
CPC ...
H01R 4/58 (2013.01); B32B 15/018 (2013.01); C22C 5/06 (2013.01); C23C 22/07 (2013.01); C23C 28/021 (2013.01); C25D 5/10 (2013.01); C25D 5/12 (2013.01); C25D 5/48 (2013.01); C25D 5/50 (2013.01); C25D 5/505 (2013.01); C25D 7/00 (2013.01); C25D 9/02 (2013.01); C25D 11/36 (2013.01); H01B 1/02 (2013.01); H01R 43/00 (2013.01); C25D 3/12 (2013.01); C25D 3/30 (2013.01); C25D 3/38 (2013.01); C25D 3/46 (2013.01); C25D 3/562 (2013.01); H01R 13/03 (2013.01); Y10T 428/12472 (2015.01); Y10T 428/12722 (2015.01); Y10T 428/12778 (2015.01);
Abstract

The present invention provides metallic materials for electronic components, having low degree of whisker formation, low adhesive wear property and high durability, and connector terminals, connectors and electronic components using such metallic materials. The metallic material for electronic components includes: a base material; a lower layer formed on the base material, the lower layer being constituted with one or two or more selected from a constituent element group A, namely, the group consisting of Ni, Cr, Mn, Fe, Co and Cu; an intermediate layer formed on the lower layer, the intermediate layer being constituted with one or two or more selected from a constituent element group B, namely, the group consisting of Ag, Au, Pt, Pd, Ru, Rh, Os and Ir; and an upper layer formed on the intermediate layer, the upper layer being constituted with an alloy composed of one or two or more selected from the constituent element group B, namely, the group consisting of Ag, Au, Pt, Pd, Ru, Rh, Os and Ir and one or two selected from a constituent element group C, namely, the group consisting of Sn and In; wherein the thickness of the lower layer is 0.05 μm or more and less than 5.00 μm; the thickness of the intermediate layer is 0.01 μm or more and less than 0.50 μm; and the thickness of the upper layer is 0.02 μm or more and less than 0.80 μm.


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