The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Oct. 01, 2019
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Da Il Eom, Goyang-si, KR;
Keewon Kim, Yeongtong-gu, KR;
Byeongtaek Bae, Yongin-si, KR;
Minkyung Lee, Hwaseong-si, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 51/00 (2006.01); H01L 27/30 (2006.01); H01L 51/42 (2006.01); H01L 21/66 (2006.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
H01L 51/0031 (2013.01); H01L 22/30 (2013.01); H01L 27/307 (2013.01); H01L 51/4213 (2013.01); H01L 51/4253 (2013.01); G02F 2203/69 (2013.01); H01L 27/14605 (2013.01); H01L 27/14621 (2013.01); H01L 27/14636 (2013.01); H01L 27/14647 (2013.01);
Abstract
A method of measuring an image sensor is disclosed. The method includes connecting a measurement unit to an image sensor, producing an electric current, which sequentially flows through a second connection line, second lower electrodes, an upper electrode, first lower electrodes, and a first connection line of the image sensor, using the measurement unit, and measuring an alignment state of the lower electrodes, the photoelectric conversion layer, and the upper electrode.