The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Aug. 29, 2019
Applicant:

Nanya Technology Corporation, New Taipei, TW;

Inventor:

Shih-Fan Kuan, Taoyuan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 21/311 (2006.01); H01L 21/3105 (2006.01);
U.S. Cl.
CPC ...
H01L 21/7682 (2013.01); H01L 21/31053 (2013.01); H01L 21/31111 (2013.01);
Abstract

A method of manufacturing a semiconductor structure includes forming a precursor structure on a substrate. The precursor structure includes a first conductive structure, a first spacer layer, and a spacer oxide layer sequentially on the substrate. The spacer oxide layer exposes a top surface of the first spacer layer. The spacer oxide layer is then recessed. A second spacer layer is formed to cover the spacer oxide layer and the first spacer layer. A portion of the second spacer layer and a portion of the spacer oxide layer are then etched to expose the lateral portion of the first spacer layer. The remaining spacer oxide layer is etched to form an air gap between the first spacer layer and the second spacer layer. A third spacer layer is formed on the lateral portion of the first spacer layer to seal the air gap.


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