The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Nov. 30, 2018
Canon Medical Systems Corporation, Otawara-shi, JP;
The University of Central Florida Research Foundation, Inc., Orlando, FL (US);
Qiulin Tang, Buffalo Grove, IL (US);
Alexander Katsevich, Oviedo, FL (US);
Zhou Yu, Wilmette, IL (US);
Wenli Wang, Briarcliff Manor, NY (US);
CANON MEDICAL SYSTEMS CORPORATION, Otawara-shi, JP;
THE UNIVERSITY OF CENTRAL FLORIDA RESEARCH FOUNDATION, Inc., Orlando, FL (US);
Abstract
An apparatus and method are provided for computed tomography (CT) imaging to reduce truncation artifacts due to a part of an imaged object being outside the scanner field of view (FOV) for at least some views of a CT scan. After initial determining extrapolation widths to extend the projection data to fill a truncation region, the extrapolation widths are combined into a padding map and smoothed to improve uniformity and remove jagged edges. Then a hybrid material model fits the measured projection data nearest the truncation region to extrapolate projection data filling the truncation region. Smoothing the padding map is improved by the insight that in general smaller extrapolation widths are more accurate and trustworthy. Further, practical applications often include multiple inhomogeneous materials. Thus, the hybrid material model provides a better approximation than single material models, and more accurate fitting is achieved.