The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Apr. 26, 2018
Siemens Healthcare Gmbh, Erlangen, DE;
Ute Feuerlein, Erlangen, DE;
Christian Hofmann, Erlangen, DE;
Robert Mayer, Lauf/Schoenberg, DE;
Rainer Raupach, Heroldsbach, DE;
Grzegorz Soza, Heroldsberg, DE;
SIEMENS HEALTHCARE GMBH, Erlangen, DE;
Abstract
An adaptive method for generating CT image data is described. In the method, projection measurement data of an examination region of an examination object is acquired. Furthermore, uncorrected image data of the examination region is generated. Artifact-affected subregions of the examination region are determined on the basis of at least one part of the uncorrected image data. An artifact-reduced image reconstruction is carried out in the artifact-affected subregions of the examination region. Only artifact-reduced subimage data of the artifact-affected subregions is generated. Finally, artifact-reduced image data of the entire examination region is generated by combining at least one part of the uncorrected image data and the artifact-reduced subimage data. A reconstruction device is also described. Moreover, a computed tomography system is described.