The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Sep. 12, 2018
Applicant:

Cognex Corporation, Natick, MA (US);

Inventors:

Nathaniel Bogan, Natick, MA (US);

Zihan Hans Liu, Cambridge, MA (US);

Assignee:

Cognex Corporation, Natick, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/20 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/75 (2017.01); G06T 2207/10028 (2013.01);
Abstract

The techniques described herein relate to methods, apparatus, and computer readable media configured to test a pose of a model to image data. Image data of an object is received, the image data comprising a set of data entries. A set of regions of the image data are determined, wherein each region in the set of regions comprises an associated set of neighboring data entries in the set of data entries. Processed image data is generated, wherein the processed image data comprises a set of cells that each have an associated value, and generating the processed image data comprises, for each region in the set of regions, determining a maximum possible score of each data entry in the associated set of neighboring data entries from the image data, setting one or more values of the set of values based on the determined maximum possible score, and testing the pose of the model using the processed image data.


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