The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Dec. 12, 2018
Goodrich Corporation, Charlotte, NC (US);
Haijun Hu, Westford, MA (US);
Goodrich Corporation, Charlotte, NC (US);
Abstract
A system and method of processing an image is provided in which an input image output by an imaging sensor is received. For each location of a plurality of locations of a reference point of a moving window in the input image, a first image quality metric is determined as a function of quality of first image content included in a region covered by the moving window, wherein the window is sized to include at least a significant portion of a target of interest. An enhancement process is applied to the input image and generates a resulting enhanced image that is spatially registered with the input image. For each location of the plurality of locations of the reference point of the moving window in the enhanced image, a second image quality metric is determined as a function of quality of second image content included in the region covered by the moving window. For each location of the plurality of locations, first fused content is determined by a first fusing of the first image content with the second image content, the first fusing being a function of the first image content, the first image quality metric, the second image content, and the second image quality metric associated with the location. A fused image is generated that includes the first fused content determined for each of the locations of the plurality of locations.